High-power, accuracy and flexibility 

in a laboratory configuration

The AXRD®-LPD laboratory diffractometer is easy to use and provides accurate and reliable measurements. Equipped with either hybrid photon counting linear detectors, area detectors or our energy-discriminating silicon point detector (SPD), the AXRD®-LPD has extremely fast data collection capabilities. With an angular accuracy of < ± 0.01° Δ2θ over the full angular range, the AXRD®-LPD has the necessary performance and accessories for even the most demanding powder diffraction and high-resolution x-ray diffraction material investigation.The AXRD®-LPD has everything you need for phase identification, quantitative phase analysis, percent crystallinity, crystallite size and strain, Rietveld refinement, characterization of films and thin coatings, structure analysis, rocking curves, reciprocal space mapping and In-plane diffraction. With multiple sample stages and holders, powerful software and database options, the AXRD®-LPD provides the versatility you need for your measurements.